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[IEEE 2010 11th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2010.03.22-2010.03.24)] 2010 11th International Symposium on Quality Electronic Design (ISQED) - Signal probability control for relieving NBTI in SRAM cells

✍ Scribed by Kunitake, Yuji; Sato, Toshinori; Yasuura, Hiroto

Book ID: 121256445
Publisher: IEEE
Year: 2010
Weight: 932 KB
Category: Article
ISBN: 1424464544
DOI: 10.1109/ISQED.2010.5450504

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