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[IEEE 2010 11th International Symposium on Quality of Electronic Design (ISQED) - San Jose, CA, USA (2010.03.22-2010.03.24)] 2010 11th International Symposium on Quality Electronic Design (ISQED) - A novel two-dimensional scan-control scheme for test-cost reduction

✍ Scribed by Lin, Chia-Yi; Chen, Hung-Ming

Book ID: 120187980
Publisher: IEEE
Year: 2010
Weight: 363 KB
Category: Article
ISBN: 1424464544
DOI: 10.1109/ISQED.2010.5450439

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