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[IEEE 2009 Spanish Conference on Electron Devices (CDE) - Santiago de Compostela, Spain (2009.02.11-2009.02.13)] 2009 Spanish Conference on Electron Devices - Experimental characterization of NBTI effect on pMOSFET and CMOS inverter

✍ Scribed by Fernandeza, R.; Kaczer, B.; Gago, J.; Rodriguez, R.; Nafria, M.

No coin nor oath required. For personal study only.

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