✦ LIBER ✦

[IEEE 2009 Spanish Conference on Electron Devices (CDE) - Santiago de Compostela, Spain (2009.02.11-2009.02.13)] 2009 Spanish Conference on Electron Devices - Channel Hot-Carrier degradation in short channel devices with high-k/metal gate stacks

✍ Scribed by Amat, E.; Kauerauf, T.; Degraeve, R.; Rodriguez, R.; Nafria, M.; Aymerich, X.; Groeseneken, G.

No coin nor oath required. For personal study only.

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