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[IEEE 2009 International Conference on Microelectronics - ICM - Marrakech, Morocco (2009.12.19-2009.12.22)] 2009 International Conference on Microelectronics - ICM - Modeling of the pH-ISFET thermal drift

✍ Scribed by Naimi, S. E.; Hajji, B.; Habbani, Y.; Humenyuk, I.; Launay, J.; Temple-Boyer, P.

Book ID: 125462151
Publisher: IEEE
Year: 2009
Weight: 724 KB
Category: Article
ISBN: 1424458145
DOI: 10.1109/icm.2009.5418627

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