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[IEEE 2009 International Conference on Microelectronics - ICM - Marrakech, Morocco (2009.12.19-2009.12.22)] 2009 International Conference on Microelectronics - ICM - Scaling the bulk-driven MOSFET

✍ Scribed by Urban, Christopher; Moon, James E.; Mukund, P. R.

Book ID: 118734696
Publisher: IEEE
Year: 2009
Weight: 666 KB
Category: Article
ISBN: 1424458145
DOI: 10.1109/ICM.2009.5418591

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