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[IEEE 2009 IEEE International Electron Devices Meeting (IEDM) - Baltimore, MD, USA (2009.12.7-2009.12.9)] 2009 IEEE International Electron Devices Meeting (IEDM) - Experimental assessment of self-heating in SOI FinFETs

✍ Scribed by Scholten, A.J.; Smit, G.D.J.; Pijper, R.M.T.; Tiemeijer, L.F.; Tuinhout, H.P.; van der Steen, J.-L.P.J.; Mercha, A.; Braccioli, M.; Klaassen, D.B.M.

Book ID: 126616688
Publisher: IEEE
Year: 2009
Weight: 181 KB
Category: Article
ISBN: 1424456398
DOI: 10.1109/IEDM.2009.5424362

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