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[IEEE 2009 IEEE International Electron Devices Meeting (IEDM) - Baltimore, MD, USA (2009.12.7-2009.12.9)] 2009 IEEE International Electron Devices Meeting (IEDM) - Performance comparisons of tunneling field-effect transistors made of InSb, Carbon, and GaSb-InAs broken gap heterostructures

โœ Scribed by Luisier, Mathieu; Klimeck, Gerhard


Book ID
121246707
Publisher
IEEE
Year
2009
Tongue
English
Weight
298 KB
Category
Article
ISBN
1424456398

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