𝔖 Bobbio Scriptorium

✦ LIBER ✦

[IEEE 2009 IEEE International Electron Devices Meeting (IEDM) - Baltimore, MD, USA (2009.12.7-2009.12.9)] 2009 IEEE International Electron Devices Meeting (IEDM) - Program charge effect on random telegraph noise amplitude and its device structural dependence in SONOS flash memory

✍ Scribed by Chiu, J.P.; Chou, Y.L.; Ma, H.C.; Tahui Wang, ; Ku, S.H.; Zou, N.K.; Chen, Vincent; Lu, W.P.; Chen, K.C.; Chih-Yuan Lu,

Book ID: 120298113
Publisher: IEEE
Year: 2009
Weight: 384 KB
Category: Article
ISBN: 1424456398
DOI: 10.1109/IEDM.2009.5424210

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

[IEEE 2009 IEEE International Electron D

[IEEE 2009 IEEE International Electron Devices Meeting (IEDM) - Baltimore, MD, USA (2009.12.7-2009.12.9)] 2009 IEEE International Electron Devices Meeting (IEDM) - GPU technology trends and future requirements

✍ Chen, John Y. 📂 Article 📅 2009 🏛 IEEE 🌐 English ⚖ 1012 KB

[IEEE 2009 IEEE International Electron D

[IEEE 2009 IEEE International Electron Devices Meeting (IEDM) - Baltimore, MD, USA (2009.12.7-2009.12.9)] 2009 IEEE International Electron Devices Meeting (IEDM) - A 45nm generation Phase Change Memory technology

✍ Servalli, G. 📂 Article 📅 2009 🏛 IEEE 🌐 English ⚖ 459 KB

[IEEE 2009 IEEE International Electron D

[IEEE 2009 IEEE International Electron Devices Meeting (IEDM) - Baltimore, MD, USA (2009.12.7-2009.12.9)] 2009 IEEE International Electron Devices Meeting (IEDM) - Graphene for VLSI: FET and interconnect applications

✍ Awano, Yuji 📂 Article 📅 2009 🏛 IEEE 🌐 English ⚖ 711 KB

[IEEE 2009 IEEE International Electron D

[IEEE 2009 IEEE International Electron Devices Meeting (IEDM) - Baltimore, MD, USA (2009.12.7-2009.12.9)] 2009 IEEE International Electron Devices Meeting (IEDM) - Development of graphene FETs for high frequency electronics

✍ Lin, Yu-Ming; Jenkins, Keith; Farmer, Damon; Valdes-Garcia, Alberto; Avouris, Ph 📂 Article 📅 2009 🏛 IEEE 🌐 English ⚖ 304 KB

[IEEE 2009 IEEE International Electron D

[IEEE 2009 IEEE International Electron Devices Meeting (IEDM) - Baltimore, MD, USA (2009.12.7-2009.12.9)] 2009 IEEE International Electron Devices Meeting (IEDM) - Germanium for advanced CMOS anno 2009: a SWOT analysis

✍ Caymax, M.; Eneman, G.; Bellenger, F.; Merckling, C.; Delabie, A.; Wang, G.; Loo 📂 Article 📅 2009 🏛 IEEE 🌐 English ⚖ 442 KB

[IEEE 2009 IEEE International Electron D

[IEEE 2009 IEEE International Electron Devices Meeting (IEDM) - Baltimore, MD, USA (2009.12.7-2009.12.9)] 2009 IEEE International Electron Devices Meeting (IEDM) - Experimental assessment of self-heating in SOI FinFETs

✍ Scholten, A.J.; Smit, G.D.J.; Pijper, R.M.T.; Tiemeijer, L.F.; Tuinhout, H.P.; v 📂 Article 📅 2009 🏛 IEEE ⚖ 181 KB