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[IEEE 2009 First International Conference on Advances in System Simulation (SIMUL) - Porto, Portugal (2009.09.20-2009.09.25)] 2009 First International Conference on Advances in System Simulation - Two Level Approach for Validation of Microscopic Simulation Models

✍ Scribed by Detering, Stefan; Schnieder, Eckehard

Book ID: 120155854
Publisher: IEEE
Year: 2009
Weight: 237 KB
Category: Article
ISBN: 1424448638
DOI: 10.1109/SIMUL.2009.20

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