[IEEE 2009 First International Conference on Advances in System Testing and Validation Lifecycle (VALID) - Porto (2009.09.20-2009.09.25)] 2009 First International Conference on Advances in System Testing and Validation Lifecycle - Scenario-Based Test Case Generation Using Event-B Models

✍ Scribed by Malik, Q.A.; Lilius, J.; Laibinis, L.

• Book ID: 115539616
• Publisher: IEEE
• Year: 2009
• Weight: 387 KB
• Volume: 0
• Category: Article
• ISBN: 142444862X
• DOI: 10.1109/valid.2009.22