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[IEEE 2009 Fifth International Conference on MEMS NANO, and Smart Systems - Dubai, United Arab Emirates (2009.12.28-2009.12.30)] 2009 Fifth International Conference on MEMS NANO, and Smart Systems - Single Electron Fault in QCA Inverter Gate

✍ Scribed by Mahdavi, Mojdeh; Amiri, Mohammad Amin; Mirzakuchaki, Sattar; Moghaddasi, Mohammad Naser

Book ID: 125856892
Publisher: IEEE
Year: 2009
Weight: 420 KB
Category: Article
ISBN: 0769539386
DOI: 10.1109/ICMENS.2009.23

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