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[IEEE 2009 Fifth International Conference on MEMS NANO, and Smart Systems - Dubai, United Arab Emirates (2009.12.28-2009.12.30)] 2009 Fifth International Conference on MEMS NANO, and Smart Systems - Characterization and Tolerance of QCA Full Adder under Missing Cells Defects

โœ Scribed by Javid, Mohamad; Mohamadi, Karim


Book ID
118236989
Publisher
IEEE
Year
2009
Weight
355 KB
Volume
0
Category
Article
ISBN
0769539386

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