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[IEEE 2009 European Conference on Radiation and Its Effects on Components and Systems (RADECS) - Brugge, Belgium (2009.09.14-2009.09.18)] 2009 European Conference on Radiation and Its Effects on Components and Systems - Analysis of the single event effects for a 90nm CMOS phase-locked loop

✍ Scribed by Kauppila, A. V.; Loveless, T. D.; Vaughn, G. L.; Bhuva, B. L.; Massengill, L. W.; Holman, W. T.

Book ID: 120544553
Publisher: IEEE
Year: 2009
Weight: 576 KB
Category: Article
ISBN: 1457704927
DOI: 10.1109/RADECS.2009.5994580

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