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[IEEE 2009 Design, Automation & Test in Europe Conference & Exhibition (DATE'09) - Nice (2009.04.20-2009.04.24)] 2009 Design, Automation & Test in Europe Conference & Exhibition - Gate replacement techniques for simultaneous leakage and aging optimization

✍ Scribed by Yu Wang, ; Xiaoming Chen, ; Wenping Wang, ; Yu Cao, ; Yuan Xie, ; Huazhong Yang,

Book ID: 125900738
Publisher: IEEE
Year: 2009
Weight: 438 KB
Category: Article
ISBN: 3981080157
DOI: 10.1109/DATE.2009.5090683

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