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[IEEE 2009 Design, Automation & Test in Europe Conference & Exhibition (DATE'09) - Nice (2009.04.20-2009.04.24)] 2009 Design, Automation & Test in Europe Conference & Exhibition - A self-adaptive system architecture to address transistor aging

✍ Scribed by Khan, O.; Kundu, S.

Book ID: 121003248
Publisher: IEEE
Year: 2009
Weight: 264 KB
Category: Article
ISBN: 3981080157
DOI: 10.1109/DATE.2009.5090637

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