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[IEEE 2009 67th Annual Device Research Conference (DRC) - University Park, PA, USA (2009.06.22-2009.06.24)] 2009 Device Research Conference - Modeling and performance analysis of high-speed, high-power GaN nanowire FETs

✍ Scribed by Khayer, M. Abul; Lake, Roger K.

No coin nor oath required. For personal study only.

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