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[IEEE 2009 52nd IEEE International Midwest Symposium on Circuits and Systems (MWSCAS) - Cancun, Mexico (2009.08.2-2009.08.5)] 2009 52nd IEEE International Midwest Symposium on Circuits and Systems - Assessment of CNTFET based circuit performance and robustness to PVT variations

✍ Scribed by Cho, Geunho; Kim, Yong-Bin; Lombardi, Fabrizio

Book ID: 127394923
Publisher: IEEE
Year: 2009
Weight: 668 KB
Category: Article
ISBN: 1424444799
DOI: 10.1109/mwscas.2009.5235961

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