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[IEEE 2009 52nd IEEE International Midwest Symposium on Circuits and Systems (MWSCAS) - Cancun, Mexico (2009.08.2-2009.08.5)] 2009 52nd IEEE International Midwest Symposium on Circuits and Systems - Performance of CNFET SRAM cells under diameter variation corners

✍ Scribed by Zhang, Zhe; Liu, Yanmin; Nyathi, Jabulani; Delgado-Frias, Jose G.

Book ID: 127051336
Publisher: IEEE
Year: 2009
Weight: 557 KB
Category: Article
ISBN: 1424444799
DOI: 10.1109/mwscas.2009.5236035

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