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[IEEE 2009 22nd International Vacuum Nanoelectronics Conference (IVNC) - Hamamatsu, Japan (2009.07.20-2009.07.24)] 2009 22nd International Vacuum Nanoelectronics Conference - Effect of field penetration on electron energy distribution of field emission from N-Si emitter

✍ Scribed by Yuan, Guang; Neo, Yoichiro; Shimawaki, Hidetaka; Mimura, Hidenori

Book ID: 126603639
Publisher: IEEE
Year: 2009
Weight: 432 KB
Category: Article
ISBN: 1424435870
DOI: 10.1109/IVNC.2009.5271566

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