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[IEEE 2009 22nd International Vacuum Nanoelectronics Conference (IVNC) - Hamamatsu, Japan (2009.07.20-2009.07.24)] 2009 22nd International Vacuum Nanoelectronics Conference - Field emission and ion microscopy about cloverleaf pattern

✍ Scribed by Neo, Yoichiro; Aoki, Toru; Mimura, Hidenori; Matsumoto, Takahiro; Tomita, Makoto; Sasaki, Masahiro; Yokoo, Kuniyoshi

Book ID: 126629521
Publisher: IEEE
Year: 2009
Weight: 490 KB
Category: Article
ISBN: 1424435870
DOI: 10.1109/IVNC.2009.5271677

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