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[IEEE 2009 22nd International Conference on VLSI Design: concurrently with the 8th International Conference on Embedded Systems - New Delhi, India (2009.01.5-2009.01.9)] 2009 22nd International Conference on VLSI Design - WOR-BIST: A Complete Test Solution for Designs Meeting Power, Area and Performance Requirements

โœ Scribed by Yao, Chunhua; Saluja, Kewal K.; Sinkar, Abhishek A.


Book ID
120196604
Publisher
IEEE
Year
2009
Weight
308 KB
Category
Article
ISBN
0769535062

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