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[IEEE 2009 22nd International Conference on VLSI Design: concurrently with the 8th International Conference on Embedded Systems - New Delhi, India (2009.01.5-2009.01.9)] 2009 22nd International Conference on VLSI Design - Efficient Techniques for Directed Test Generation Using Incremental Satisfiability

✍ Scribed by Mishra, Prabhat; Chen, Mingsong

Book ID: 126746803
Publisher: IEEE
Year: 2009
Weight: 204 KB
Category: Article
ISBN: 0769535062
DOI: 10.1109/VLSI.Design.2009.72

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