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[IEEE 2008 Twenty-fourth Annual IEEE Semionductor Thermal Measurement and Management Symposium - San Jose, CA, USA (2008.03.16-2008.03.20)] 2008 Twenty-fourth Annual IEEE Semionductor Thermal Measurement and Management Symposium - Transient Thermal Imaging Using Thermoreflectance

✍ Scribed by Maize, K.; Christofferson, J,; Shakouri, A.

Book ID: 126940040
Publisher: IEEE
Year: 2008
Weight: 399 KB
Category: Article
ISBN: 1424421241
DOI: 10.1109/stherm.2008.4509366

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