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[IEEE 2008 Twenty-fourth Annual IEEE Semionductor Thermal Measurement and Management Symposium - San Jose, CA, USA (2008.03.16-2008.03.20)] 2008 Twenty-fourth Annual IEEE Semionductor Thermal Measurement and Management Symposium - Transient Measurement of the Junction-To-Case Thermal Resistance Using Structure Functions: Chances and Limits

✍ Scribed by Schweitzer, Dirk; Pape, Heinz; Chen, Liu

Book ID: 121483101
Publisher: IEEE
Year: 2008
Weight: 321 KB
Category: Article
ISBN: 1424421241
DOI: 10.1109/STHERM.2008.4509389

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