𝔖 Bobbio Scriptorium

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[IEEE 2008 Second International Symposium on Intelligent Information Technology Application (IITA) - Shanghai, China (2008.12.20-2008.12.22)] 2008 Second International Symposium on Intelligent Information Technology Application - SVM Classifier for Analog Fault Diagnosis Using Fractal Features

✍ Scribed by Mao, Xianbai; Wang, Liheng; Li, Changxi

Book ID: 118245675
Publisher: IEEE
Year: 2008
Weight: 363 KB
Volume: 0
Category: Article
ISBN: 076953497X
DOI: 10.1109/iita.2008.249

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