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[IEEE 2008 Second International Symposium on Intelligent Information Technology Application (IITA) - Shanghai, China (2008.12.20-2008.12.22)] 2008 Second International Symposium on Intelligent Information Technology Application - The Comparison of Two Typical Corner Detection Algorithms

✍ Scribed by Zou, Li-hui; Chen, Jie; Zhang, Juan; Dou, Li-hua

Book ID: 115496453
Publisher: IEEE
Year: 2008
Weight: 493 KB
Volume: 0
Category: Article
ISBN: 076953497X
DOI: 10.1109/iita.2008.275

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