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[IEEE 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design - Opio, France (2008.05.18-2008.05.22)] 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design - Si Nanocrystal Split Gate Technology Optimization for High Performance and Reliable Embedded Microcontroller Applications

✍ Scribed by Kang, Sung-Taeg; Yater, Jane; Hong, Cheongmin; Shen, James; Ellis, Nicole; Herrick, Matthew; Gasquet, Horacio; Malloch, Wendy; Chindalore, Gowrishankar

Book ID: 120626517
Publisher: IEEE
Year: 2008
Weight: 749 KB
Category: Article
ISBN: 1424415462
DOI: 10.1109/NVSMW.2008.23

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