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[IEEE 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design - Opio, France (2008.05.18-2008.05.22)] 2008 Joint Non-Volatile Semiconductor Memory Workshop and International Conference on Memory Technology and Design - A Study of Sub-40nm FinFET BE-SONOS NAND Flash

✍ Scribed by Hsu, Tzu-Hsuan; Lue, Hang-Ting; Peng, Wu-Chin; Tsai, Cheng-Hung; King, Ya-Chin; Wang, Szu-Yu; Wu, Ming-Tsung; Hong, Shih-Ping; Hsieh, Jung-Yu; Yang, Ling-Wu; Lian, Nan-Tzu; Yang, Tahone; Chen, Kuang-Chao; Hsieh, Kuang-Yeu; Liu, Rich; Lu, Chih-Yuan

Book ID: 120298138
Publisher: IEEE
Year: 2008
Weight: 796 KB
Category: Article
ISBN: 1424415462
DOI: 10.1109/NVSMW.2008.39

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