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[IEEE 2008 International Symposium on Electromagnetic Compatibility - EMC Europe - Hamburg, Germany (2008.09.8-2008.09.12)] 2008 International Symposium on Electromagnetic Compatibility - EMC Europe - Electric and magnetic near-field measurements in industrial environments

✍ Scribed by Atienza, Andreu; Aragon, Marc; Quilez, Marcos; Silva, Ferran

Book ID: 121711075
Publisher: IEEE
Year: 2008
Weight: 286 KB
Category: Article
DOI: 10.1109/emceurope.2008.4786826

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