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[IEEE 2008 International Symposium on Electromagnetic Compatibility - EMC Europe - Hamburg, Germany (2008.09.8-2008.09.12)] 2008 International Symposium on Electromagnetic Compatibility - EMC Europe - Modeling interference coupling between two orthogonal strip lines on adjacent layers

✍ Scribed by Araki, Kenji; Xiao, Fengchao; Kami, Yoshio; Bishnoi, Hemant; Drewniak, James L.

Book ID: 121284989
Publisher: IEEE
Year: 2008
Weight: 361 KB
Category: Article
DOI: 10.1109/EMCEUROPE.2008.4786849

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