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[IEEE 2008 International Conference on Condition Monitoring and Diagnosis - Beijing, China (2008.04.21-2008.04.24)] 2008 International Conference on Condition Monitoring and Diagnosis - Development of distributed on-line monitoring system for dielectric loss tangent of high voltage capacitive apparatus

✍ Scribed by Gao Qiang, ; Ding Pinnan, ; Han Yue, ; Geng Baohong,

Book ID: 118155208
Publisher: IEEE
Year: 2008
Weight: 359 KB
Volume: 0
Category: Article
ISBN: 1424416213
DOI: 10.1109/cmd.2008.4580498

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