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[IEEE 2008 International Conference on Condition Monitoring and Diagnosis - Beijing, China (2008.04.21-2008.04.24)] 2008 International Conference on Condition Monitoring and Diagnosis - A novel algorithm of dielectric loss measurement based on orthogonal decomposition

✍ Scribed by Duan Dapeng, ; Qian Yong, ; Zeng Yi, ; Sun Caixin, ; Jiang Xiuchen,

Book ID: 118155207
Publisher: IEEE
Year: 2008
Weight: 272 KB
Volume: 0
Category: Article
ISBN: 1424416213
DOI: 10.1109/cmd.2008.4580394

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