[IEEE 2008 IEEE/ACM International Conference on Computer-Aided Design (ICCAD) - San Jose, CA, USA (2008.11.10-2008.11.13)] 2008 IEEE/ACM International Conference on Computer-Aided Design - Overlay aware interconnect and timing variation modeling for Double Patterning Technology

[IEEE 2008 IEEE/ACM International Confer

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[IEEE 2008 IEEE/ACM International Confer

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