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[IEEE 2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - Orlanda, FL, USA (2008.1.23-2008.1.25)] 2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - Measurement and Modeling of Drain Current Thermal Noise to Shot Noise Ratio in 90nm CMOS

✍ Scribed by Cui, Yan; Niu, Guofu; Rezvani, Ali; Taylor, Stewart S.

Book ID: 125473640
Publisher: IEEE
Year: 2008
Weight: 123 KB
Category: Article
ISBN: 1424418569
DOI: 10.1109/smic.2008.36

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