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[IEEE 2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - Orlanda, FL, USA (2008.01.23-2008.01.25)] 2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - Process-Tolerant Ultralow Voltage Digital Subthreshold Design

✍ Scribed by Roy, Kaushik; Kulkarni, Jaydeep P.; Hwang, Myeong-Eun

Book ID: 115524969
Publisher: IEEE
Year: 2008
Weight: 747 KB
Volume: 0
Category: Article
ISBN: 1424418569
DOI: 10.1109/smic.2008.17

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