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[IEEE 2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - Orlanda, FL, USA (2008.1.23-2008.1.25)] 2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - High Frequency Characterization of Compact N+Poly/Nwell Varactor Using Waffle-Layout

โœ Scribed by Morandini, Yvan; Larchanche, Jean-Francois; Gaquiere, Christophe


Book ID
120795925
Publisher
IEEE
Year
2008
Weight
290 KB
Category
Article
ISBN
1424418569

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