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[IEEE 2008 IEEE Symposium on VLSI Circuits - Honolulu, HI, USA (2008.06.18-2008.06.20)] 2008 IEEE Symposium on VLSI Circuits - Characterizing sampling aperture of clocked comparators

✍ Scribed by Jeeradit, M.; Kim, J.; Leibowitz, B.; Nikaeen, P.; Wang, V.; Garlepp, B.; Werner, C.

No coin nor oath required. For personal study only.

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