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[IEEE 2008 IEEE Symposium on VLSI Circuits - Honolulu, HI, USA (2008.06.18-2008.06.20)] 2008 IEEE Symposium on VLSI Circuits - Characterization of bit transistors in a functional SRAM

✍ Scribed by Xiaowei Deng, ; Wah Kit Loh, ; Pious, Beena; Houston, Theodore W.; Liu, Larry; Bashar Khan, ; Corum, Dan

No coin nor oath required. For personal study only.

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