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[IEEE 2008 IEEE National Aerospace and Electronics Conference - Dayton, OH, USA (2008.07.16-2008.07.18)] 2008 IEEE National Aerospace and Electronics Conference - Fault Modeling and Analysis for Bridging Defects in a Synchronizer

✍ Scribed by Kim, Hyoung-Kook; Jone, Wen-Ben

Book ID: 115512981
Publisher: IEEE
Year: 2008
Weight: 209 KB
Volume: 0
Category: Article
ISBN: 1424426154
DOI: 10.1109/naecon.2008.4806580

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