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[IEEE 2008 IEEE National Aerospace and Electronics Conference - Dayton, OH, USA (2008.07.16-2008.07.18)] 2008 IEEE National Aerospace and Electronics Conference - Relative Track Metrics to Determine Model Mismatch

✍ Scribed by Blasch, Erik; Rice, Andrew; Yang, Chun; Kadar, Ivan

Book ID: 115510213
Publisher: IEEE
Year: 2008
Weight: 469 KB
Volume: 0
Category: Article
ISBN: 1424426154
DOI: 10.1109/naecon.2008.4806556

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