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[IEEE 2008 IEEE MTT-S International Microwave Symposium Digest - MTT 2008 - Atlanta, GA, USA (2008.06.15-2008.06.20)] 2008 IEEE MTT-S International Microwave Symposium Digest - An extrinsic component parameter extraction method for high power RF LDMOS transistors

✍ Scribed by Wood, J.; Lamey, D.; Guyonnet, M.; Chan, D.; Bridges, D.; Monsauret, N.; Aaen, P. H.

Book ID: 124085490
Publisher: IEEE
Year: 2008
Weight: 363 KB
Category: Article
ISBN: 1424417805
DOI: 10.1109/MWSYM.2008.4633239

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