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[IEEE 2008 IEEE MTT-S International Microwave Symposium Digest - MTT 2008 - Atlanta, GA, USA (2008.06.15-2008.06.20)] 2008 IEEE MTT-S International Microwave Symposium Digest - High frequency electromagnetic analysis - A historical perspective

✍ Scribed by Rautio, James C.

Book ID: 126749088
Publisher: IEEE
Year: 2008
Weight: 283 KB
Category: Article
ISBN: 1424417805
DOI: 10.1109/MWSYM.2008.4632932

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