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[IEEE 2008 IEEE International High Level Design Validation and Test Workshop (HLDVT) - Incline Village, NV, USA (2008.11.19-2008.11.21)] 2008 IEEE International High Level Design Validation and Test Workshop - Automating defects simulation and fault modeling for SRAMs

✍ Scribed by Di Carlo, Stefano; Prinetto, Paolo; Scionti, Alberto; Al-Ars, Zaid

Book ID: 126731284
Publisher: IEEE
Year: 2008
Weight: 430 KB
Category: Article
ISBN: 1424429226
DOI: 10.1109/HLDVT.2008.4695898

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