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[IEEE 2008 First International Conference on Emerging Trends in Engineering and Technology - Nagpur, Maharashtra, India (2008.07.16-2008.07.18)] 2008 First International Conference on Emerging Trends in Engineering and Technology - Notice of Violation of IEEE Publication PrinciplesMeasuring the Quality of Software Modularization Using Coupling-Based Structural Metrics for an OOS System

✍ Scribed by Aruna, M.; Devi, M.P. Suguna; Deepa, M.

Book ID: 120224220
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 724 KB
Edition: Cdrth
Category: Article
ISBN: 0769532675
DOI: 10.1109/ICETET.2008.76

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