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[IEEE 2008 First International Conference on Emerging Trends in Engineering and Technology - Nagpur, Maharashtra, India (2008.07.16-2008.07.18)] 2008 First International Conference on Emerging Trends in Engineering and Technology - Interconnect Slew Metric Using Nakagami-M Distribution

✍ Scribed by Gupta, Shainky; Chattaraj, Anuran; Kar, Rajib; Mal, Ashish Kumar

Book ID: 115478453
Publisher: IEEE
Year: 2008
Tongue: English
Weight: 200 KB
Edition: Cdrth
Volume: 0
Category: Article
ISBN: 0769532675
DOI: 10.1109/icetet.2008.12

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