𝔖 Bobbio Scriptorium

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[IEEE 2008 First International Conference on Emerging Trends in Engineering and Technology - Nagpur, Maharashtra, India (2008.07.16-2008.07.18)] 2008 First International Conference on Emerging Trends in Engineering and Technology - Identification of Fault in HVDC Converters Using Wavelet Based Multi-Resolution Analysis

✍ Scribed by Keswani, Rashmi Aspi

Book ID: 115536481
Publisher: IEEE
Year: 2008
Weight: 354 KB
Volume: 0
Category: Article
ISBN: 0769532675
DOI: 10.1109/icetet.2008.150

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