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[IEEE 2008 9th International Symposium of Quality of Electronic Design (ISQED) - San Jose, CA, USA (2008.03.17-2008.03.19)] 9th International Symposium on Quality Electronic Design (isqed 2008) - A Statistical Characterization of CMOS Process Fluctuations in Subthreshold Current Mirrors

✍ Scribed by Zhang, Lei; Yu, Zhiping; He, Xiangqing

Book ID: 121306630
Publisher: IEEE
Year: 2008
Weight: 447 KB
Category: Article
ISBN: 0769531172
DOI: 10.1109/ISQED.2008.4479717

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