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[IEEE 2008 9th International Symposium of Quality of Electronic Design (ISQED) - San Jose, CA, USA (2008.03.17-2008.03.19)] 9th International Symposium on Quality Electronic Design (isqed 2008) - Characterization of Standard Cells for Intra-Cell Mismatch Variations

✍ Scribed by Sundareswaran, Savithri; Abraham, Jacob A.; Ardelea, Alexandre; Panda, Rajendran

Book ID: 120168907
Publisher: IEEE
Year: 2008
Weight: 726 KB
Category: Article
ISBN: 0769531172
DOI: 10.1109/ISQED.2008.4479728

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