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[IEEE 2008 9th International Symposium of Quality of Electronic Design (ISQED) - San Jose, CA, USA (2008.03.17-2008.03.19)] 9th International Symposium on Quality Electronic Design (isqed 2008) - High Output Resistance and Wide Swing Voltage Charge Pump Circuit

✍ Scribed by Xia, Tian; Wyatt, Stephen

Book ID: 121299652
Publisher: IEEE
Year: 2008
Weight: 349 KB
Category: Article
ISBN: 0769531172
DOI: 10.1109/ISQED.2008.4479709

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